Journals
  Publication Years
  Keywords
Search within results Open Search
Please wait a minute...
For Selected: Toggle Thumbnails
Reversible data hiding method based on high-order bit-plane redundancy
Cong XU, Xingtian WANG, Yongpeng TAO
Journal of Computer Applications    2022, 42 (1): 171-177.   DOI: 10.11772/j.issn.1001-9081.2021020237
Abstract283)   HTML7)    PDF (1374KB)(143)       Save

Focused on the problems of low hiding capacity and poor quality of decrypted labeled images in the existing Reversible Data Hiding in Encrypted Image (RDHEI) methods, a new RDHEI method based on high-order bit-plane redundancy was proposed. Firstly, the original image was encrypted in blocks by Logistic mapping, and the redundancy of the high-order bit-plane of the pixels in the blocks was retained. Secondly, according to the rule of whether the numbers of high-order bits and low-order bits in the block were the same, the encrypted image blocks were divided into embeddable blocks and non-embeddedable blocks, and the low-order bit value of the pixel was replaced with the corresponding high-order bit value in the embeddable blocks, so that the high-order bit-plane redundancy was transferred to the low-order bit-plane. Finally, the confidential information was embedded in the embedding space vacated in the inner-block low-order bit-plane. After that, the operations of data extraction, image decryption and image lossless recovery were realized by the receiver with the key. In the simulation experiments on 6 images in the USC-SIPI standard image library, when the number of high-order bit-planes is equal to 3, the proposed method has the average embedding rate of the image of 1.73 bpp, and the average Peak Signal-to-Noise Ratio (PSNR) of the marked image after direct decryption reaches 47.20 dB. The experimental results show that the proposed method not only increases the information embedding capacity of the encrypted image, but also increases the PSNR value of the labeled image after direct decryption.

Table and Figures | Reference | Related Articles | Metrics